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pp. 259-281 in Defects in Microelectronic Materials and Devices, ed. by D. Fleetwood, R. Schrimpf and S. T. Pantelides, CRC Press, Boca Raton, Florida (2008).
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S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, and P. D. Nellist, "Quantum Mechanical Resolution Limits to Imaging and Spectroscopy in the Transmission Electron Microscope" (PDF 928 KB)
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