1. S. J. Pennycook, A. R. Lupini, M. Varela, A. Y. Borisevich, Y. Peng, M. P. Oxley and M. F. Chisholm, "Scanning Transmission Electron Microscopy for Nanostructure Characterization," pp. 152-191 in Scanning Microscopy for Nanotechnology: Techniques and Applications, ed. by W. Zhou and Z. L. Wang, Springer (2006).
  2. Eiji ABE and Stephen J. Pennycook, "Ultrahigh-resolution Scanning Transmission Electron Microscopy with Sub-Ångstrom-Sized Electron Beams," Journal of Crystallography Society of Japan, Vol. 47, pp. 26-31, (2005).
  3. W. Grogger, M. Varela, R. Ristau, B. Schaffer, F. Hofer, ad K.M. Krishnan, "Energy-Filtring Transmission Electron Microscopy on the Nanometer Length Scale" (PDF 806K), Journal of Electron Spectroscopy 143, 139-147 (2005).
  4. M. Varela, A. R. Lupini, K. van Benthem, A. Y. Borisevich, M. F. Chisholm, N. Shibata, E. Abe, and S. J. Pennycook, "Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope" (PDF 1041MB), Annual Reviews of Materials Research 35, 539-569 (2005).
  5. A. Bleloch and A. Lupini, "Imaging at the Picoscale" (PDF 1045 KB), Materials Today 7(12), 42-48, (2004).
  6. S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, and P. D. Nellist, "Quantum Mechanical Resolution Limits to Imaging and Spectroscopy in the Transmission Electron Microscope" (PDF 928 KB), p. 126 in From the Atomic to the Nano Scale, edited by J. McGuire et al., Old Dominion University, 2003.
  7. S. J. Pennycook, A. R. Lupini, A. Borisevich, M. Varela, Y. Peng, P. D. Nellist, G. Duscher, R. Buczko and S. T. Pantelides, "Transmission Electron Microscopy: Overview and Challenges" (PDF 1.5 MB)
    p. 627 in  Characterization and Metrology for ULSI Technology, AIP Conference Proceedings Vol 683, New York : American Institute of Physics, 2003.
  8. S. J. Pennycook, “Structure Determination through Z-Contrast Microscopy,” (PDF 1.2MB) p. 173 in Advances in Imaging and Electron Physics, Vol 123, ed. by P. G. Merli, G. Calestani, and M. Vittori-Antisari, 2002.
  9. S. J. Pennycook, C. Prouteau, M. F. Chisholm, D. K. Christen, D. Verebelyi, D. P. Norton, M. Kim, N. D. Browning, J. P. Buban, Y. Pan, and J. F. Hamet, “The Relationship Between Grain Boundary Structure and Current Transport in High-Tc Superconductors,”(PDF 1.6 MB), Chapter 6 in Studies of High Temperature Superconductors: Microstructural Studies in HTSC, Vol 30, ed. by A. V. Narlikar, Nova Science Publishers, New York, 2000.
  10. P. D. Nellist and S. J. Pennycook "The Principles and Interpretation of Annular Dark-Field Z-contrast imaging," p.147-203 in Advances in Imaging and Electron Physics, 2000.
  11. S. J. Pennycook and P. D. Nellist, “Z-Contrast Scanning Transmission Electron Microscopy,” p. 161 in Impact of Electron Scanning Probe Microscopy on Materials Research, ed. by D. Rickerby, G. Valdrè, and U. Valdrè, Kluwer Academic Publishers, The Netherlands, 1999
  12. S. J. Pennycook, N. D. Browning, M. M. McGibbon, A. J. McGibbon, D. E. Jesson, and M. F. Chisholm, “Direct Determination of Interface Structure and Bonding with the Scanning Transmission Electron Microscope,”
    Philos. T. Roy. Soc. A 354, 2619 (1996).
  13. S. J. Pennycook, D. E. Jesson, A. J. McGibbon, P. D. Nellist, “High Angle Dark Field STEM for Advanced Materials,” J. Electron Microsc. 45, 36 (1996).
  14. N. D. Browning and S. J. Pennycook, “Atomic-Resolution Electron Energy-Loss Spectroscopy in the Scanning Transmission Electron Microscope,”
    J. Microsc-Oxford 180, 230 (1995).
  15. S. J. Pennycook, N. D. Browning, D. E. Jesson, M. F. Chisholm, and A. J. McGibbon, “Atomic-Resolution Imaging and Spectroscopy of Semiconductor Interfaces,” Appl. Phys. A 57, 385 (1993).
  16. S. J. Pennycook, “Z-Contrast Transmission Electron-Microscopy-Direct Atomic Imaging of Materials,” Annu. Rev. Mater. Sci. 22, 171 (1992)
  17. S. J. Pennycook, “Atomic-Scale Imaging of Materials Chemistry by Z-Contrast Scanning Transmission Electron Microscopy,” Anal. Chem. 64, 263 A (1992).
  18. S. J. Pennycook, “Z-Contrast STEM for Materials Science,” Ultramicroscopy 30, 58 (1989.
  19. S. J. Pennycook, “High Resolution Electron Microscopy and Microanalysis,” Contemp. Phys. 23, 371 (1982).

[MST Home] [ORNL Home]
[Site Index] [Search] [Contact Us] [Disclaimer] [Webmaster]
Oak Ridge National Laboratory is a national multi-program research and development facility
managed by UT-Battelle, LLC for the U.S. Department of Energy