Microscopes

Nion UltraSTEM

• Initially installed with a VG 100 kV cold field emission gun it will be upgraded to a 200 kV Nion cold field emission gun in 2010. With a full 5th order aberration corrector, it provides the highest combination of spatial and energy resolution available.

VG Microscopes HB603U STEM with Nion aberration corrector

• 300 kV, cold field emission, ultra-high resolution STEM attains a beam size of ~ 0.78 Å, providing Z-contrast imaging with the annular dark field detector, and simultaneous, aberration-corrected, phase contrast imaging with the bright field detector. A modified objective lens and column extension provides efficient coupling into the Gatan Enfina electron energy loss spectrometer.

VG Microscopes HB501UX STEM with Nion aberration corrector

• 100 kV, cold field emission, high resolution STEM giving a beam size close to 1 Å. Also equipped with a Gatan Enfina parallel detection electron energy loss spectrometer and a cathodoluminescence detection system.

VG Microscopes HB601 STEM with Nion aberration corrector

• 100 kV, cold field emission, high resolution STEM giving a beam size close to 1 Å. Nion pole piece allows tilts of ± 30 ?‹. To be equipped with facilities for electron beam induced current and cathodoluminescence spectroscopy.