Microscopes
VG Microscopes HB603U STEM with Nion aberration corrector:
300 kV, cold field emission, ultra-high resolution STEM attains a beam size of 0.6 Å, providing unparalled sensitivity for Z-contrast imaging with the annular dark field detector, and simultaneous, aberration-corrected, phase contrast imaging with the bright field detector. A Gatan Enfina electron energy loss spectrometer will be added late 2004.
VG Microscopes HB501UX STEM with Nion aberration corrector:
100 kV, cold field emission, high resolution STEM giving a beam size close to 1 Å. Also equipped with a Gatan Enfina parallel detection electron energy loss spectrometer and a cathodoluminescence detection system.
VG Microscopes HB601 STEM:
A second 100 kV STEM is currently being installed with a high resolution pole piece to give Z-contrast imaging and EELS at 2.2 Å resolution.
|
