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Covers
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Brave New Nanoworld(PDF 2.4MB)
ReView, Vol. 32, No. 3 (1999) |
ET Yu and SJ Pennycook
Nanoscale Characterization of Materials (867KB)
and MF Chisholm and SJ Pennycook
Z-contrast Imaging of Grain-Boundary Core Stuctures in Semiconductors (1.5MB)
MRS Bulletin, March 1997 |
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SJ Pennycook,
Imaging in Materials Science (PDF 784KB),
and DE Jesson and SJ Pennycook,
High Resolution Z-Contrast Imaging of Semiconductor Interfaces (PDF 1.9MB),
in MRS Bulletin, March 1991 |
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SJ Pennycook,
Toward a One-Angstrom Electron Microscope (PDF 1.7MB)
ReView, 23, No.1, 54 (1990) |
A CoSi2/Si(001) interface showing an unusual reconstruction. See MF Chisholm et al.,
Z-Contrast Investigation of the Ordered Atomic Interface of CoSi2/Si(001) Layers (PDF 1 MB), Appl. Phys. Lett. 64, 3608 (1994) and
New Interface Structure for A-Type CoSi2/Si(111) (PDF 464KB),
Appl. Phys. Lett. 64, 2409 (1994) |
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